The NSFE is part of the NANOscientific Symposium Series a gloabl event series focused on advanced techniques in Atomic Force Microscopy (AFM), Imaging Spectroscopic Ellipsometry (ISE), and nanotechnology applications in material and life sciences.

NSFE2025 is designed for researchers, engineers, students, and industry professionals working in materials science, life sciences, and surface analysis. The symposium offers:
- Hands-on sessions with cutting-edge instruments
- Expert talks from leading scientists
- Networking opportunities with peers and innovators

The 8th edition of the NANOscientific Forum Europe will be held from September 17th - 19th, 2025 at the Laboratory of Solid State Physics (LPS), located in Orsay, France, approximately 25 km southwest of Paris. THe LPS is a research institute of Paris-Saclay University, affiliated with the National Center for Scientific Research (CNRS) as a joint research unit (UMR 8502).

This year’s host is Dr. Stanislas Rohart, a specialist in magnetic imaging (STM and MFM) and micromagnetism. He pioneered investigations on the Dzyaloshinskii-Moriya interaction in ultrathin films and its consequences on chiral domain walls and skyrmions. His present research mostly focuses on magnetic skyrmions in ferromagnetic and magnetically compensated films.

The scientific focus this year will include Magnetic Force Microscopy and 2D Materials, as well as new developments and innovative methods in nanotechnology and correlative microscopy. Attendees will have the opportunity to hear from and engage with distinguished keynote speakers, such as our host Stanislas Rohart and Dr. Rebeca Ribeiro-Palau from C2N, among others. Explore the full program.

The event will extend beyond scientific discussions and offer participants many networking opportunities, such as the conference dinner on a scenic Seine river cruise and the social event at a local winery.

As in previous years, there will be Hands-on Sessions on Park Systems tools, showcasing basic and advanced measuring techniques, as well as tips and tricks on how to obtain stunning AFM and ISE data:

See nanoscale characterization redefined with Park’s FX200 IR AFM. From high-precision PiFM-based IR spectroscopy to automated laser alignment and advanced AFM modes, this system delivers unmatched insight into nanomechanical, electrical, and thermal properties.

Experience how Ellipsometry visualizes buried interfaces, anisotropic structures, and fluid interlayers in real time, and bring your own samples to see them come alive under the lens of Mueller Matrix Ellipsometry. And much, much more.

Park Systems Instruments, you will get to see live:
- FX200 IR AFM - integrating nanoscale infrared (IR) spectroscopy with atomic force microscopy (AFM) to deliver advanced chemical and materials characterization.
- FX40 AFM - the automatic AFM streamlines data collection, research workflows, and data publication, empowering accelerated scientific progress and discovery.
- NX10 AFM - the premier choice for cutting-edge materials science research that provides ease of use with high-resolution capabilities.
- Accurion Simon - combining the sensitivity of thickness and refractive index measurements with the imaging capabilities of microscopy.
- Reflection DHM R 2200 with stroboscopic unit - recording holograms produced by the interference between the beam transmitted through the sample, and a reference beam generated inside of the microscope.