Volume 30 | 21 May 2026
NANOscientific Magazine, 2026
The 2026 NANOscientific Symposium is set to be a landmark event, uniting global experts in the fields of nanoscience and nanotechnology. This year, we extend our focus beyond Scanning Probe Microscopy (SPM) to encompass a broader range of nanotechnological applications and innovations.
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From Non-Contact AFM to Functional Nanoscopy Expanding the Capabilities of Scanning Probe Microscopy
Over the past four decades, atomic force microscopy has evolved from a surface imaging tool into a versatile platform for nanoscale characterization. Beyond topography, AFM now enables measurement of electrical, magnetic, thermal, and optical properties with high spatial resolution. This transformation was driven by the need to understand functionality at the nanoscale, particularly in semiconductor manufacturing and advanced materials research....
From Laboratory Curiosity to Industrial Infrastructure....
Volume 30 | 21 May 2026
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an Interview with John Foster on Calvin Quate and the Birth of AFM....
Volume 30 | 21 May 2026
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Active AFM Cantilevers And The New Research They Enable
Volume 30 | 21 May 2026
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Nanoscale Dynamic Mechanical Analysis with AFM at Sub-Zero....
Volume 30 | 21 May 2026
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